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Lecturer(s)
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Soubusta Jan, prof. Mgr. Ph.D.
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Machulka Radek, Mgr. Ph.D.
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Tomáštík Jan, Mgr. Ph.D.
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Course content
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- Basics of nanophotonics, spatial confinement: similarities and differences between photons and electrons, localization, tunneling. Interaction with nanostructures for photons (evanescent waves, plasma resonance) and for electrons (quantum mechanical size effect, Coulomb blockade). Overview of usage of mentioned phenomena in present and future components for optoelectronics - Photospectroscopy, overview of optical methods for studying nanostructures. Description of different methods of photoluminescence measurement utilizing microscopy and time resolution. - Near field scanning microscopy. Diffraction limit and optical system resolution. Principle of operation based on evanescent waves. Practical demonstration using scanning probe. Usage for the study of nanostructures. Principles of operation of scanning probe microscopy, study of spectroscopic properties of individual molecules. - Scanning tip microscopes, scanning tunneling microscopy (STM) and atomic force microscopy (AFM), modification of AFM with the use of other interactions: work function, electrostatic force, magnetic force, measurement with local detection of electric current of capacity - Energy transformation in nanostructures, basics of photovoltaic phenomenon in classical solar cells, effect limiting the efficiency of photovoltaic transformation, usage of properties of nanostructures for the increase of the efficiency: multiplication of carriers, photon fusion, multiple generation of charge carriers. Basics of photoelectrochemical cells: a dye-sensitized solar cells, photoelectrochemical decomposition of water.
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Learning activities and teaching methods
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Lecture
- Attendace
- 30 hours per semester
- Homework for Teaching
- 20 hours per semester
- Preparation for the Exam
- 40 hours per semester
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Learning outcomes
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Brief introduction to nanophotonics, describing phenomena at the interface of solid state physics and optics. The lecture presents techniques of microscopy in near field and scanning probe microscopes. Next energetic conversion in nanostructures and utilization of nanostructures properties for efficiency increase is explained.
Knowledge. Overview of modern techniques for characterizing nanoscale objects. Insight in future applications; ability to search in journals to find informations on this scientific area; experience with work in the study group.
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Prerequisites
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Prior knowledge of the undergraduate physics.
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Assessment methods and criteria
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Mark
Knowledge of the course topics, ability to discuss about the course topics in wider contexts Passing the examination
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Recommended literature
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Butt, H.J., Cappella, B., Kappl, M. (2005). Force measurements with the atomic force microscope: Technique, interpretation and applications. Surface Science Reports 59, 1-152.
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Colton, J. (2004). Nanoscale measurements and manipulation. J. Vac.Sci.Technol. B22, 1609.
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Girard, G., Joachin, C. Gauthier, S. (2000). The physics of the near-field. Rep. Prog. Phys. 63, 893 - 938.
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Kuntze, S.B., Ban, D., Sargent, E.H., St. Dixon-Warren, J., White, J.K. and Hinzer, K. (2005). Electrical Scanning Probe Microscopy: Investigating the Inner Workings of Electronic and Optoelectronic Devices. Critical Reviews in Solid State and Materials Sciences, 30:71-124.
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Nelson, J. (2003). The Physics of Solar Cells. Imperial College Press, World Scientific Singapore.
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Prasad, P.N. (2004). Nanophotonics. Wiley, New Jersey.
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