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Lecturer(s)
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Matěj Adam, Mgr. Ph.D.
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Panáček Aleš, doc. RNDr. Ph.D.
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Berka Karel, doc. RNDr. Ph.D.
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Course content
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Introduction Theoretical principles of scanning microscopes Design of scanning microscopes Basics of ultrahigh vacuum Scanning tunneling microscopy Atomic force microscopy Kelvin probe microscopy Advanced spectroscopies Atomic and spin resolution of solid state surfaces Atomic manipulations Advanced application of scanning probe microscopy
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Learning activities and teaching methods
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Lecture
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Learning outcomes
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The aim of this course is to provide deeper foundations of scanning probe microscopes and their applications in contemporary science. We discuss the basic theory and engineering design of scanning tunneling microscopes and atomic force microscopes. We will deal with different measurement principles, including advanced spectroscopy (e.g. tunneling, inelastic tunneling and force spectroscopy). We will explain the basic principles of the Kelvin probe measurements and of the combined scanning tunneling microscope and atomic force microscope. We will discuss the atomic and spin resolution, different types of atomic manipulation or advanced measurements of mechanical and transport properties of nanostructures.
Principles of scanning tunneling microscopy, atomic force microscopy, Kelvin probe, atomic resolution, atomic manipulation.
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Prerequisites
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unspecified
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Assessment methods and criteria
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Oral exam
Basics of quantum mechanics
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Recommended literature
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Chen, C. J. (2007). Introduction to Scanning Tunneling Microscopy. Oxford.
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Mironov, V. L. (2004). Fundamentals of Scanning Probe Microscopy.
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Vogitlander, B. (2015). Scanning Probe Microscopy. Springer.
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