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Lecturer(s)
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Kubínek Roman, doc. RNDr. CSc.
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Course content
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<ul> <li> Scanning tunneling microscopy (STM) <li> Principles of atomic force microscopy (AFM) - contact, non-contact and tapping modes <li> MFM - Magnetic force microscopy <li> LFM - Lateral force microscopy and others scanning probe microscopy (SPM) techniques <li> SPM as a surface analytical tool <li> Environment of SPM methods <li> Scanners - constructions, defects, hardware and software correction, test of linearity of the scanner, cantilevers and tips <li> The artifacts of the images <li> Tip-surface convolution effect <li> Feedback artifacts <li> Possibilities of computer image analysis, testing of artifacts <li> Applications of SPM </ul>
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Learning activities and teaching methods
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Lecture
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Learning outcomes
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<ul> <li> Scanning tunneling microscopy (STM), AFM. Applications of SPM.
Evaluation Evaluate the particular methods and principles, explain the aspects and results concerning the given issue, integrate the knowledge, predict the solutions, evaluate the results and outcomes.
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Prerequisites
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unspecified
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Assessment methods and criteria
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Mark
<ul> <li> Knowledge within the scope of the course topics (examination) </ul>
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Recommended literature
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