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Lecturer(s)
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Nemec Ivan, doc. Ing. Ph.D.
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Course content
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Factors influencing the diffraction intensity. Types of scan. Classification of diffractometers. Modern trends in X-ray technique (synchrotron sources, CCD detectors, imaging plates, computing chains). Low temperature measurements; neutron diffraction. Internet and crystallography, software, databases.
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Learning activities and teaching methods
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Lecture
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Learning outcomes
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The course introduces students to basic concepts of crystallochemistry and X-ray analysis.
Recall X-ray diffraction analysis - theory, methods, new approaches, applications.
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Prerequisites
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unspecified
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Assessment methods and criteria
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Oral exam
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Recommended literature
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(1998). Crystallographic Instrumentation by L. A. Aslanov, G. V. Fetisov and J. A. K. Howard. Edited by J.A.K Howard, International Union of Crystallography, Oxford University Press.
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(1983). International Tables for Crystallography. Reidel Publishing Company, Dordrecht, Boston.
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Manuály k programovým balíkům. (k dispozici v elektronické podobě).
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Giazovazzo, C. et al. (1994). Fundamentals of Crystallography. Oxford Science Publications, IUCr.
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Glusker, J. P., Lewis, M. & Rossi, M. (1994). Crystal Structure Analysis for Chemists and Biologists. VCH Publishers, New York.
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Luger, P. (1980). Modern X-ray analysis of single crystals. W. de Gruyter, Berlin-New York.
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